Design engineers developing advanced electronics face increased EMC challenges from high-speed data circuits and RF components. Efficient design processes necessitate early insight into the EMC performance of the circuits.  Anritsu Company partnered with Y.I.C. Technologies to develop groundbreaking tools to support EMC pre-compliance measurements.

The Y.I.C scanners and EMViewer software coupled with Anritsu spectrum analysers provide a unique 3D heat map of all radiated signals. Circuit layout and shielding materials can be optimised before submitting the product to a certified test house, maximising the chances of a first-time pass and minimising repeated submissions. Y.I.C. Technologies is a developer of FAST magnetic very-near-field measurement technologies and applications, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.

“With our solutions which are now compatible with Anritsu Field Master spectrum analysers we offer a unique way to look at your design and give you the opportunity to fix all the issues in the near field, which will guarantee a first-time pass at the chamber.  We look forward to welcoming all Anritsu users to our EMC family” says Cornelle Roberts, Global Sales & Channel manager at Y.I.C. Technologies.

EMC testing is an increasingly important part of product development, especially in the Aerospace & Defense and Medical Electronics markets. Efficient product development requires specialised design tools and Anritsu are delighted to partner with Y.I.C Technologies to deliver effective solutions for this market

“EMC testing is an increasingly important part of the test industry market and the EMScanner and EMViewer products provide engineers with deep insights at a speed never before possible” says Angus Robinson, Spectrum Analyser Product Manager at Anritsu.